INDUSTRIAL PREPAREDNESS STUDY ON DEVICES 13, 14, 15. EXTENDED LIFE TEST 8000 HOUR DATA REPORT
Abstract
Research was continued on the effects of temperature and power dissipation stresses on silicon power transistors o t to 8000 hours. The Extended life test program was comple ed involving type 2N1484 at the 8000 hour interval and types 2N1480 and 2N1488 at the 1000 hour interval. Static operating circuits are shown. The 8000 hour 2N1484 data is shown for seven temperature levels and four operating power levels. The 1000-hour data (2N1480, 2N1488), for correlation purposes, is shown at one operating power level each. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1962
- Accession Number
- AD0294847
Entities
People
- John Wright
- M.b. Alexander