PRODUCTION ENGINEERING MEASURE RELIABILITY IMPROVEMENT JET ETCH TRANSISTOR
Abstract
The optimum collector resistivity, the optimum collector thickness, the optimum electrical basewidth, and the proper emitter placement were determined. Investigations leading to these determinations are described. Work has continued toward devising a method to stop automatically the delineation etching process after the collector junction was delineated. Some progress was made in this area, and work is continuing. Two new process steps were introduced and descriptions of these are also given. The status of the program, life test results to date, and current failure rates are also presented.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 31, 1962
- Accession Number
- AD0295057
Entities
People
- J. E. Krantz
- J. H.d. Folster
- R. M. Gagne
Organizations
- Sprague Electric