SPECTROGRAPHIC ANALYSIS OF TRACE ELEMENTS IN ALUMINUM OXIDE MATRICES

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1963
Accession Number
AD0401887

Entities

People

  • John J. Fitzgerald

Organizations

  • Air Force Cambridge Research Laboratories

Tags

Communities of Interest

  • Advanced Electronics
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Air Force
  • Aluminum
  • Aluminum Oxides
  • Calibration
  • Department Of Defense
  • Electronic Materials
  • Elements
  • Impurities
  • Intensity
  • Materials
  • Measurement
  • Oxides
  • Photographic Processing
  • Precision
  • Standards
  • United States