SEMICONDUCTOR RELIABILITY

Abstract

Efforts were made to determine quality assurance requirements for specific semiconductor devices, and to determine confidence limits for the shape parameter beta of the Weilbull distribution. Reliability and life test data were obtained from manufacturers of semiconductor devices and equip ment and from field use. This data is analyzed and integrated to provide: (a) information on failure rates from life tests and field opera tion, (b) application data based on the varia bility of important electrical characteristics under life test conditions, and (c) information on decreasing failure ates and on responses of different junction types to application of various stresses.

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Document Details

Document Type
Technical Report
Publication Date
Apr 30, 1963
Accession Number
AD0403120

Entities

People

  • George J. Blakemore

Organizations

  • ARINC

Tags

DTIC Thesaurus Topics

  • Age Distribution
  • Confidence Limits
  • Contracts
  • Corporations
  • Data Analysis
  • Failure Mode And Effect Analysis
  • Intervals
  • Life Tests
  • Radio Frequency
  • Reliability
  • Semiconductor Devices
  • Semiconductors
  • Specifications
  • Time Intervals
  • Transistors

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Snow Cover Descriptors for Reptiles and Their Illustrations.
  • Statistical inference.

Technology Areas

  • Microelectronics