THE RESEARCH AND DEVELOPMENT OF HIGH CURRENT AND HIGH VOLTAGE SILICON CONTROLLED RECTIFIERS

Abstract

A study of the relationship between SCR design parameters and electrical characteristics has been made and a discussion of the pertinent points is presented. A computer analysis of the affects of differing sizes of internal emitter shorts has been completed and is summarized. A number of the test procedures and the nomenclature which is used are included.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1963
Accession Number
AD0403152

Entities

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Computers
  • Current Density
  • Electronics Laboratories
  • Heat Sinks
  • High Voltage
  • Impedance
  • Measurement
  • Modules (Electronics)
  • P-N Junctions
  • Plastic Explosives
  • Power Electronics
  • Rectifiers
  • Semiconductor Devices
  • Semiconductors
  • Silicon Controlled Rectifiers
  • Test Methods
  • Thermal Resistance

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  • Electrical Engineering