DIFFRACTION PATTERN ANALYSIS OF A RECTANGULAR APERTURE IN THE PRESENCE OF ABERRATIONS. PART 1. DERIVATION OF A GENERAL SOLUTION
Abstract
A general solution of the diffraction integral for a rectangular aperture considered in scanning procedures of diffraction patterns is discussed. It is shown that in the presence of aberrations, the integrand in Fresnel- Kirchhoff's diffraction formula can be expanded into a series. By this expansion, the two-dimensilnal diffraction in tegral is converted into a summation, the single terms of which divide into products of two functions where only one-dimensional integrations over products of Legendre polynomials are to be performed. In these integrations, use is made of the orthogonality property of Legendre's poly nomials. Particular solutions are obtained con cerning the two-dimensional diffraction pattern intensity distribution in the Gaussian image plane for an aberrant optical system and the three-dimensional intensity distribution near the focus of an aberration-free optical system.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1963
- Accession Number
- AD0403797
Entities
Organizations
- Lockheed Martin Missiles and Space