INVESTIGATION OF THE STRUCTURAL AND MAGNETIC PROPERTIES OF THIN FERROMAGNETIC FILMS
Abstract
Permalloy films evaporated at normal and oblique incidence to a substrate were examined by replication of their surfaces. Electron micrographs revealed chains of particles perpendicular to the incident beam when the angle of incidence was lesser than 70 degrees and parallel to the incident beam when the angle was greater than 70 degrees. The degree of alignment depended upon the angle of incidence and thickness of the film. Permalloy films were epitaxially grown on NaCl and were annealed by electron bombardment in an electron microscope. Perfect single crystal diffraction patterns indicated the presence of (100) parent crystals and (122) twin crystals. Fringe patterns observed on electron micrographs were identified by dark field microscopy and electron diffraction as being caused by platelets of twins 100-400 angstroms thick, lying parallel to (111) planes of the parent crystal. The non-integral reflections were shown to be caused by double diffraction.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1963
- Accession Number
- AD0403892
Entities
People
- A. Baltz
- William Doyle