SILICON PLANAR EPITAXIAL TRANSISTOR TYPE 2N2193

Abstract

Contents: Improved KPR resolution Contact evaporation and alloying Collector etching Boron diffusion Phosphorus diffusion Collector Contact to the header Interconnections Reliability Measurement Inspection and quality control plan

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1963
Accession Number
AD0404185

Entities

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Accuracy
  • Analysis Of Variance
  • Automatic
  • Encapsulation
  • Fabrication
  • High Temperature
  • Life Tests
  • Manufacturing
  • Materials
  • Production
  • Prototypes
  • Quality Control
  • Reliability
  • Semiconductor Devices
  • Semiconductors
  • Stress Tests
  • Test And Evaluation

Readers

  • Semiconductor Device Technology