BETA-SILICON CARBIDE AND ITS POTENTIAL FOR DEVICES

Abstract

P-type crystals were grown using boron and aluminum additions to the silicon melts. Some difficulty arose as a result of compensation by impurities in the boron employed, but doping levels obtained using aluminum additions appeared quite uniform and amenable to control. Satisfactory results are anticipated for boron when higher purity, zone-refined rod form is used. Ohmic contacts were obtained on low resistivity (0.1 to 1.0 ohm-cm) n-type silicon carbide by soldering gold wires directly to the crystals. A number of crystals were prepared for Hall measurements (five-contact method) using this technique. For high resistivity silicon carbide, ohmic contacts were prepared by flash-fusing carbon-saturated silicon on the crystal surfaces in an arc-image furnace. Rectifying contacts were prepared by this technique using carbon-free silicon of the proper conductivity type. Simple diodes were produced from p-type beta-silicon carbide crystals. Intense light was observed at the emitting junction when some of these diodes were being tested.

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Document Details

Document Type
Technical Report
Publication Date
May 15, 1963
Accession Number
AD0405029

Entities

People

  • F. A. Halden
  • W. E. Nelson

Organizations

  • SRI International

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Gaps
  • Carrier Mobility
  • Ceramic Materials
  • Compound Semiconductors
  • Crystal Growth
  • Crystals
  • Current Density
  • Electrical Measurement
  • Energy Bands
  • Energy Gaps
  • High Temperature
  • Materials
  • Metal-Semiconductor Junctions
  • Military Research
  • New York
  • Semiconductors
  • Silicon Carbide

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Surface Engineering/Surface Coating Technology.