THE RELIABILITY ANALYSIS OF NONELECTRONIC COMPONENTS
Abstract
The approach to the reliability prediction of nonelectronic parts can best be served by basing the technique on the mechanisms of failure. This can be brought about by transforming deterministic models relating to these mechanisms into probab ilistic time domain models. Five techniques are presented: (1) The establishment of a failure data collection and analysis system specifically for nonelectronic parts. This would over-come the present lack of empirical data; (2) Institute further investigations into the damage resulting from the progression of critical failure inducing mechanisms as a function of stress versus time; (3) Institute studies in the area of the syner gistic and/obiting effects resulting from combinations of stress; (4) The development of efficient means for the generation empirical failure data and verification of predictions; and (5) The development of unifying laws to explain the interrelationships among the entire spectrum of failure mechanisms.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1963
- Accession Number
- AD0405871
Entities
People
- Donald W. Fulton
Organizations
- Rome Laboratory