STUDY OF METHODS FOR IMPROVING SYNTHETIC QUARTZ CRYSTALS

Abstract

The local strain fields surrounding internal defects in quartz plates were used to obtain their images by both polarized light and X-ray diffraction contrast. Dislocations were delineated with a resolution of the order of 20 microns, and their densities were found to range from zero up to 10 to the 4th power lines per sq. cm. The dislocations were observed to lie in directions approximately perpendicular to the growth surfaces, and to be essentially all edge dislocations arising from (a) pre-existing dislocations in the seed plate, (b) initiation of growth at the seed surface, (c) inclusions formed during growth, and (d) regions of intensely concentrated point defects.

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Document Details

Document Type
Technical Report
Publication Date
May 15, 1963
Accession Number
AD0406262

Entities

People

  • A. E. Carlson
  • H. H. Krueger

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Biomedical
  • Energy and Power Technologies
  • Ground and Sea Platforms

DTIC Thesaurus Topics

  • Acoustic Absorption
  • Acoustic Waves
  • Acoustics
  • Cameras
  • Chemistry
  • Crystal Structure
  • Crystals
  • Diffraction
  • Elastic Properties
  • Electronics
  • Fabrication
  • Geography
  • Light Sources
  • Materials
  • Measurement
  • Photography
  • Scattering

Fields of Study

  • Physics

Readers

  • Materials Science (Mechanical Engineering).
  • Materials Science and Engineering.
  • Medical Imaging.