NEW TECHNIQUE FOR MEASUREMENT OF ELECTRON DIFFRACTION PATTERNS OF POLYCRYSTALLINE MATERIALS

Abstract

A technique for the measurement of electron diffraction patterns of polycrystalline materials is described. The image of the diffraction pattern is projected by a photographic en larger at a predetermined magnification onto a chart that is calibrated directly in d spacings. This technique is rapid, as no calculations are involved. Accuracy is equal to, or better than, that achieved with the classical method.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1963
Accession Number
AD0407467

Entities

People

  • J. H. Richardson
  • R. F. Schneidmiller

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Accuracy
  • Air Force
  • California
  • Diffraction
  • Electron Diffraction
  • Electron Microscopes
  • Electrons
  • Films
  • Magnesium
  • Magnification
  • Materials
  • Materials Science
  • Measurement
  • Microscopes
  • Particle Size
  • Polycrystals
  • United States

Fields of Study

  • Physics

Readers

  • Geodesy
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics
  • Space