RESEARCH ON DIELECTRICS FOR MICROWAVE ELECTRON DEVICES

Abstract

The theoretical study of dielectric breakdown was continued. A number of different possible mechanisms have been described and their distinguishing features identified. These features led to the design of experiments that should indicate the breakdown mechanisms in effect for each particular experiment. Measurements of the properties of sapphire were begun. The first set of tests are concerned with resistivity as a funstion of temperature and as influenced by a boundary, and with determination of vacancy concentration by spin resonance. Work on the ultra-high vacuum system is progressing. Preliminary experiments on growth of aluminum oxide films were made. A cavity for testing the effect of ionization of gas in voids of window materials was designed.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1963
Accession Number
AD0407700

Entities

People

  • D. Peters
  • Jennifer Bordeaux
  • L. Feinstein

Organizations

  • SRI International

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Aluminum Oxides
  • Band Gaps
  • Chemical Synthesis
  • Chemistry
  • Construction
  • Dielectric Properties
  • Dielectrics
  • Electrons
  • Energy Bands
  • Energy Gaps
  • Energy Transfer
  • Materials Laboratories
  • Materials Processing
  • Materials Science
  • Metal Oxides
  • Microwave Tubes
  • Oxide Films

Readers

  • Electronics Engineering
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene