PULSED NUCLEAR RADIATION INDUCED TRANSIENTS IN ELECTRONIC PARTS AND MATERIALS (GODIVA IV AND V)
Abstract
Pulsed nuclear radiation induced changes in the electrical characteristics of electronic parts and materials obtained in two experiments at the Godiva II Reactor (Los Alamos) are described and discussed. The electronic parts investigated and monitored during exposure include coaxial cables, resistors, capacitors, rectifiers, and magnetic cores of various types, values, and materials. Most of the parts during exposure show transient parameter changes which exceed the tolerance values and then generally recover to their nominal values some time after completion of the radiation pulse. Some of the data show inconsistencies which prevent the authors from drawing definite and quantitative conclusions at the present time. In some cases, e.g., low and high value resistors, NiCr thinfilm resistors of various values, and ceramic capacitors, the data show certain repeti tive patterns in the behavior of these parts which seem to permit a limited qualitative pre diction of the responses of these components under similar environmental conditions. Experi ments at Godiva-type (pulsed) facilities are being continued.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1963
- Accession Number
- AD0409579
Entities
People
- Aw. Schlosser
- H. Bruemmer
Organizations
- United States Army Communications-Electronics Command