Production Reliability Improvement Program for Germanium Transistor 2N1430

Abstract

The purpose of this measure is to direct efforts toward improving production techniques to improve the reliability of the 2N1430 Germanium transistor using as an objective a maximum operating failure rate of 0.05% per 1000 hours at 90% confidence level of 25 C.

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Document Details

Document Type
Technical Report
Publication Date
Apr 30, 1963
Accession Number
AD0409881

Entities

People

  • Henry Sivik
  • John Nussear
  • John Szarrawski

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Contracts
  • Data Analysis
  • Depth Control
  • Electronics
  • Engineering
  • Germanium
  • Government Procurement
  • Governments
  • Life Tests
  • Production
  • Production Engineering
  • Reliability
  • Semiconductor Devices
  • Test And Evaluation
  • Test Methods
  • Thermal Resistance
  • Transistors

Readers

  • Integrated Circuit Design and Technology.
  • Life Cycle Cost Analysis