ELECTRO-INTERFERENCE TEST OF THE CTLI WAFER (MRCN 6301),
Abstract
An outline of the test performed on the CTLI Instrumentation Section (Wafer) and the test results are presented. Pass or fail is determined by: (1) whether the test sample meets the specification limit requirements of GM 07-59-2617A for Conducted Generation, Radiated Generation and Antenna Conducted-Transmitter Key down tests, and (2) whether the test sample meets the specification requirements of D2-12411, Vol. II for the monitored critical parameters for all susceptibility tests. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 14, 1962
- Accession Number
- AD0411941
Entities
People
- A. F. Day Sr.
- D. P. Jones
Organizations
- Boeing