NOISE MEASUREMENTS AS A TOOL IN ELECTRON DEVICE RESEARCH.
Abstract
Equipment for secondary emission noise measure ment has been completed and put into operation. Thin film devices of the Ti-Ti2O5-Au type have been developed and useful lessons have been learned about their processing. The Philips K81A noise diode can be used for calibration at low shot noise levels. Its spectrum is white and the noise does not occur in the form of bursts. Sec ondary emission noise of gold targets has been measured. The correlation between electron emis sion noise and photon noise in MgO cathodes in creases with increasing fcy. Measurement of the ac impedance of MgO cold cathode tubes has been carried out. The Ti-Ti2O5-Au samples manu factured in our laboratory have stable character istics but only a short lifetime. A theory is given of photon noise in MgO layers and in cath odoluminescence and improved methods for detect ing this noise are devised. The methods have ap plications to other sources of photon noise. A discussion is given of various mechanisms that can explain the apparent shot noise suppression in thin film targets. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 31, 1963
- Accession Number
- AD0413071
Entities
People
- A. Vanderziel
Organizations
- University of Minnesota