X-RAY SCATTERING BY POINT DEFECTS

Abstract

An apparatus for measuring the weak X-ray scattering due to punctual or very small defects is described. It is much more sensitive than the ordinary diffractometer because the solid angle of the beam received by the counter is much larger. Results on the scattering by solid solutions, impure crystals, irradiated crystals are given.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1963
Accession Number
AD0414212

Entities

People

  • A. Guinier

Organizations

  • University of Paris

Tags

Communities of Interest

  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Absorption Coefficients
  • Alloys
  • Atoms
  • Crystal Lattices
  • Crystal Structure
  • Crystals
  • Diffraction
  • Government Procurement
  • Low Temperature
  • Measurement
  • Plastic Explosives
  • Point Defects
  • Radiation
  • Scattering
  • Solid Solutions
  • X Ray Scattering
  • X Rays

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Mathematical Modeling and Probability Theory.