HIGH-TEMPERATURE THERMAL CONDUCTIVITY MEASURE MENTS IN SEMICONDUCTORS.

Abstract

Efforts concerned the measurement of the contact and bulk thermal conductivities of semiconductors at temperatures above room temperature by means of the series comparative method. Measurements of thermal conductivity K of highly-doped p-type InSb were completed. Results on three samples are given. Calculations of the approximate thermal resistivities limited by lattice Umklapp scattering and by impurities are presented. A series comparison method was employed in measur ing thermal conductivity and effects of a magnetic field on transport properties of one sample of TiTeS and on three heavily doped samples of p-type InSb. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 31, 1963
Accession Number
AD0415941

Entities

People

  • Robert G. Morris

Organizations

  • South Dakota School of Mines and Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Compound Semiconductors
  • Conductivity
  • Electronics
  • High Temperature
  • Impurities
  • Magnetic Fields
  • Measurement
  • Physical Properties
  • Scattering
  • Semiconductors
  • Solid State Electronics
  • Thermal Conductivity
  • Transport Properties
  • Transport Ships

Fields of Study

  • Materials science

Readers

  • Plasma Physics / Magnetohydrodynamics
  • Semiconductor Device Technology
  • Snow Cover Descriptors for Reptiles and Their Illustrations.

Technology Areas

  • Microelectronics