SIMPLIFIED DETERMINATION OF DIELECTRIC CONSTANTS APPLICABLE TO MICROWAVE ABSORBERS,

Abstract

A process was studied which allows the rapid test ing of selected dielectric materials having low loss. This process was evolved by considering the general functions which provide dielectric constant and loss tangent and by making certain acceptable assumptions. The method of measure ment required the direct determination of the wavelength existing in the material under test. For selected materials, the validity of this measurement is exemplified and discussed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1963
Accession Number
AD0417231

Entities

People

  • Bruno Beek
  • Karl Kirk
  • Roger Ringlund

Organizations

  • Rome Laboratory

Tags

DTIC Thesaurus Topics

  • Absorbers (Materials)
  • Advanced Materials
  • Dielectric Permittivity
  • Dielectric Properties
  • Dielectrics
  • Engineered Materials
  • Materials
  • Measurement
  • Metamaterial Absorbers
  • Metamaterials
  • Microwaves

Readers

  • Microwave Engineering.
  • Systems Analysis and Design