PHOTOSENSITIVITY AND SECONDARY ELECTRON EMISSION FROM OXYGEN CESIUM LAYERS IN DIFFUSION PROCESSES,

Abstract

Statistically correlated data are reported on changes in photosensitivity and secondary elec tron emission associated with an increased number of metallic silver particles in the layer Cs - Cs2O, Cs, Ag - Ag2O, Ag (results obtained for 16 different devices). A Japanese method was used to introduce an excess of metal lic particles into the layer. The results ob tained are discussed with respect to the origin of photo- and secondary electron emission ob served in such layers. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1963
Accession Number
AD0417366

Entities

People

  • A. Dobrolyubsky

Organizations

  • United States Army Engineer Research and Development Laboratory

Tags

DTIC Thesaurus Topics

  • Charged Particles
  • Diffusion
  • Electron Emission
  • Electrons
  • Elementary Fermions
  • Elementary Particles
  • Emission
  • Fermions
  • Leptons
  • Particles
  • Photoexcitation
  • Photosensitivity

Fields of Study

  • Physics

Readers

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Technology Areas

  • Microelectronics
  • Microelectronics - Graphene