STUDY OF FAILURE RATE DISTRIBUTIONS OF SERIES PARALLEL CONFIGURATIONS.
Abstract
Efforts are concluded on the development of a practical method for estimating the reliability of electronic circuits in the design stage. The basis for the performance failure prediction method is the empirical mathematical model which functionally relates the pertinent circuit param eters to the performance parameter of interest. One importanct of the technique described is the statistical design of the experiments which provides a formal method for obtaining the most precise information from the minimum size experiment. Two different classes of circuits are used in developing and demonstrating the reliability prediction method, a linear amplifier circuit and a switching circuit. Empirical models are fitted for both circuits; these performance models are analyzed, the performance parameter distributions are predicted and the reliability estimated for each. An extensive bibliography on subjects related to the project is given. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1963
- Accession Number
- AD0418608
Entities
People
- A. C. Nelson
- J. B. Tommerdahl
Organizations
- RTI International