CAPACITIVE PROPERTIES OF THIN FILM DEVICES,

Abstract

Efforts were directed towards experimentation on the current transfer characteristics of very thin insulating layers. In this investigation a special bridge circuit is used to measure the capacitive properties of evaporated and sputtered thin film diodes. The low voltage limitations and nonlinear properties of the devices were considered in the instrumentation design. The measurements indicated a strong dependence of capacitance on frequency between 1 cps and 100 KCS. An increase in capacitance with DC bias was noted, but only small random variations with changes of signal amplitude. The devices were unstable and changed with both time and DC current. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1963
Accession Number
AD0419995

Entities

People

  • Richard Mark

Organizations

  • Air Force Institute of Technology

Tags

DTIC Thesaurus Topics

  • Amplitude
  • Capacitance
  • Electricity
  • Films
  • Frequency
  • Instrumentation
  • Low Voltage
  • Measurement
  • Measuring Instruments
  • Thin Films
  • Voltage

Readers

  • Materials Science and Engineering.
  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene