500 C SILICON CARBIDE RECTIFIER PROGRAM.

Abstract

Efforts were continued on the development of 500 degree C silicon carbide rectifiers. The growth rate of silicon carbide crystals prepared by the sublimation method was determined by measuring the amount of growth between successive, timed dopant additions. This was compared with the growth rate as obtained from a simple model. All values agree within a factor of five. The use of molten borax as an etchant for silicon carbide was studies. Due to its relatively slow etch rate (about 30 times slower than a molten sodium peroxide-sodium hydroxide mixture) a much finer control of the etching is possible. Details are given on the life and storage tests which were successfully passed by two silicon carbide rectifiers. An open tube-flowing gas system was shown suitable for the surface passivation of groups of silicon carbide rectifiers. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1963
Accession Number
AD0420375

Entities

People

  • D. R. Thornburg
  • Hsing-Yin Chang
  • J. Ostroski
  • L. J. Kroko
  • V. J. Jennings

Organizations

  • Westinghouse Electric Corporation

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Carbides
  • Chemical Compounds
  • Compound Semiconductors
  • Elements
  • Hydroxides
  • Peroxides
  • Rectifiers
  • Silicon
  • Silicon Carbide
  • Sodium
  • Sodium Hydroxide
  • Sublimation

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Mathematics or Statistics
  • Semiconductor Device Technology