INFRARED COATING STUDIES.
Abstract
Calculations of enhanced reflectance have been extended to cases in which the reststrahlen arise from a thick LiF film deposited on glass. It is known that the dispersion relations of the LiF films are strongly dependent on the temperature of the substrate during deposition. Accordingly the calculations have been carried out for four different deposition temperatures. High index films of index 2.7 (ZnTe) and of 3.8 (Ge) were assumed in the reflectance enhancing coating, singly or in combination with a low index film of index 1.8 (PbC12). These calculated spectrophotometric reflectance curves are presented. Results of preliminary calculations of reststrahlen enhancing coatings designed to suppress the reflectance side bands on the short wavelength side, an important consideration in the development of useful enhanced reststrahlen filters, are also presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1963
- Accession Number
- AD0422154
Entities
People
- A. F. Turner
- Chang Liu
Organizations
- United States Army Engineer Research and Development Laboratory