ACCELERATED LIFE TEST INDICATORS FOR RELIABLE SEMICONDUCTOR DEVICES,
Abstract
Efforts were directed toward investigating the usefulness of accelerated life testing for longand short-term evaluation of semiconductor devices. Short-term accelerated testing has been found useful in evaluating germanium and nonplanar silicon transistors. For planar devices longer term accelerated testing is deemed necessary and the conditions for device failure are more critical. Modes of failure must be clearly identified before meaningful extrapolations are made. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1963
- Accession Number
- AD0422356
Entities
People
- Bernard Reich
Organizations
- United States Army Communications-Electronics Command