X-RAY DIFFRACTOMETRIC EXAMINATION OF LOW TEMPERATURE PHASE TRANSFORMATIONS IN SINGLECRYSTAL STRONTIUM TITANATE,
Abstract
The lattice parameters of single-crystal strontium titanate were determined by x-ray diffraction as a function of temperature from 4.2 to 300 K. Three significant regions were found. From 65 to 110 K a tetragonal modification exists (c/a = 1.00056), from 35 to 55 K line splitting consistent with orthorhombic symmetry was observed, and at 10 K an anomalous maximum in the lattice parameter vs. temperature curve was found which suggested a third structure transformation. In the tetragonal region (at 78 K) the formation of a domain structure was observed with a polarizing microscope. The low temperature x-ray technique and x-ray cryostat are described. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1963
- Accession Number
- AD0423020
Entities
People
- Farrel W. Lytle
Organizations
- Boeing