RESEARCH INVESTIGATION OF P-I-N ELECTRON JUNCTION DETECTORS.

Abstract

Thick sources containing both thallium-204 and phosphorus-32 have been utilized in carefully specified geometries for the purpose of comparing the response of silicon lithium-drifted p-i-n junction detectors to beta-ray sources with extrapolation chamber measurements of the surface absorbed dose rate. Dose rate measurements have been made with both spectra using sources having areas of 1.04 square cm, 10.0 square cm, and 100 square cm. Open-circuit voltage measurements have been completed for all these source configuration using a number of thin-window p-i-n junction detectors. Comparison of results for the two beta-ray spectra shows a slight energy dependence in the correlation between the induced junction potential of the detectors and the surface absorbed dose rate, the softer thallium204 spectrum giving a closer correlation than that of the phosphorus-32. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 11, 1963
Accession Number
AD0424169

Entities

Organizations

  • HRL Laboratories

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Beta Ray Spectrum
  • Detectors
  • Dose Rate
  • Electrons
  • Extrapolation
  • Geometry
  • Measurement
  • Phosphorus
  • Spectra
  • Thallium

Fields of Study

  • Physics

Readers

  • Nuclear and Radiation Engineering.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics