FIELD ION MICROSCOPY OF IRON WHISKERS.

Abstract

Field ion microscopy of non-refractory metals was improved by the use of neon and neon-helium gas mixtures. A limited number of iron whiskers was observed and found to contain a high density of lattice defects, such as impurity atoms, single dislocations, and dense dislocation areas of an almost amorphous structure, particularly in the 111 region. The latter defect is an artifact caused by the stress of the evaporation field. Further progress will depend upon a reduction of this field, and the use of an image intensifier. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1963
Accession Number
AD0426698

Entities

People

  • Erwin W. Muller
  • Osamu Nishikawa

Organizations

  • Pennsylvania State University

Tags

DTIC Thesaurus Topics

  • Artifacts
  • Buildings And Structures
  • Dislocations
  • Evaporation
  • Field Ion Microscopy
  • High Density
  • Impurities
  • Metals
  • Microscopy
  • Phase
  • Refractory Metals
  • Solid Phases

Fields of Study

  • Materials science
  • Physics

Readers

  • Image Processing and Computer Vision.
  • Materials Science and Engineering.
  • Plasma Physics.