STUDY OF SURFACE STATES IN SEMICONDUCTORS,
Abstract
Research concerns a study of surface states in semiconductors. Apparatus for the pulsed field effect was assembled and tested by reproducing previous experiments on silicon and germanium surfaces. Measurements on n-type silicon indicate surface states with cross-sections of 10 to the -12th power sq cm 0.73 e.V. below the conduction band, near those previously reported at 0.62 e.V. The pulsed field effect experiment on germanium surfaces, however, revealed slow surface states whose decay times increased as adsorbed gases were removed. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1963
- Accession Number
- AD0427117
Entities
People
- G. Rupprecht