ANALYSIS OF IMPURITIES IN SOLID STATE ELECTRONIC MATERIALS.
Abstract
Use of gamma ray spectrometry greatly increases speed and flexibility of activation analysis. Detailed separation scheme given for determination of iron, copper, phosphorous and nickel in silicon using ion exchange. Non-destructive analysis of chromium in lasers and masers and gallium in yttrium iron garnets by activation analysis are described. Study of elution of Cu (II) from Dowex 1 resin is presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1963
- Accession Number
- AD0428785
Entities
People
- John O'connor