TRANSIENT RADIATION EFFECTS ON ELECTRONICS.
Abstract
Certain missile electronic circuits using Shockley diodes, silicon-controlled switches, and silicon-controlled rectifiers were irradiated to determine the threshold dose rates for transient effects and to evaluate hardening techniques. This effort has resulted in the design of firing circuits that cannot be initiated by available test levels of gamma radiation. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1964
- Accession Number
- AD0429358
Entities
People
- J. L. Hill
Organizations
- Naval Ordnance Laboratory