THERMOELECTRIC JUNCTIONING PROJECT.

Abstract

An investigation is presented of the feasibility of using x-ray fluorescent analysis to determine diffusion characteristics of junctions. Also investigated was the effect of applying barrier films to the thermoelectric materials by electrolytic plating and multielectrode sputtering. A system of physical measurements was initiated and checked to determine a comparison and quality control of the various methods used in preparing thermoelectric couples. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 31, 1963
Accession Number
AD0430243

Entities

People

  • James E. Robinson

Organizations

  • Whirlpool Corporation

Tags

DTIC Thesaurus Topics

  • Absorbers (Materials)
  • Advanced Materials
  • Diffusion
  • Engineered Materials
  • Materials
  • Measurement
  • Metamaterial Absorbers
  • Metamaterials
  • Quality Control
  • Sputtering
  • X Rays

Fields of Study

  • Materials science
  • Physics

Readers

  • Optical Physics and Photonics.
  • Surface Engineering/Surface Coating Technology.
  • Thin Film Deposition Science.