PRODUCTION ENGINEERING MEASURES TO IMPROVE TRANSISTOR RELIABILITY.
Abstract
Efforts were continued on the establishment of a PEM to improve transistor reliability. The areas covered are: material preparation; thermal dissipation of package; assembly; cleaning techniques; final preparation prior to assembly; controlled formation of surface oxides; welding; post weld conditioning. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1963
- Accession Number
- AD0431546
Entities
Organizations
- Texas Instruments