500 WATT SILICON POWER TRANSISTOR.

Abstract

Efforts were continued on the development of 500watt silicon power transistors. The studies pointed to two general areas in controlling secondary breakdown: (1) to provide control of thermal runaway and structural advantage for best heat transfer; and (2) to provide minimum probability of generating non-uniform current distribution and thereby hot spots. Two testing methods and equipment for each were completed and put into operation. These testers, in conjunction with the present power test method, cover both the transient and steady-state operation of a device. They now allow an adequate measure of the device capability. Device design calculations were made using both manual and computer methods. Initial checks on junction characteristics were made. Preliminary design of the encapsulation was made. The dimensions, however, are not scheduled to be finalized until the device design is completed. (Author)

Document Details

Document Type
Technical Report
Publication Date
Jan 30, 1964
Accession Number
AD0431756

Entities

Organizations

  • Westinghouse Electric Corporation

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Computers
  • Electronic Equipment
  • Encapsulation
  • Heat Transfer
  • Hot Spots
  • Probability
  • Steady State
  • Test Methods
  • Transistors

Readers

  • Aerospace Test and Evaluation
  • Electrical Engineering
  • Semiconductor Device Technology