PRODUCTION ENGINEERING MEASURE ON 2N1708 SILICON PLANAR EPITAXIAL TRANSISTOR. VOLUME I.

Abstract

A production run was made to demonstrate the reliability achieved as a result of process improvements incorporated into the processing. A summary of the work performed in each of the major processing areas to effect the improvement is described in this report. A program of life testing, analysis of existing life test data and failure analysis was performed concurrently with the work in the processing area. This program included accelerated testing on both storage and operating life tests which lead to the establishment of acceleration curves, the analysis of results on extended life tests, the analysis of failures, and a study of the effect of aging. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 30, 1963
Accession Number
AD0435114

Entities

People

  • G. F. Granger
  • L. R. Possemato

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Accelerated Testing
  • Engineering
  • Failure Analysis
  • Life Tests
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Reliability
  • Transistors

Fields of Study

  • Engineering

Readers

  • Aerospace Test and Evaluation
  • Semiconductor Device Technology