PRODUCTION ENGINEERING MEASURE RELIABILITY IMPROVEMENT JET ETCH TRANSISTOR.
Abstract
Further work on methods of monitoring collector delineation revealed that the V subCE method is the most satisfactory. Consequently, this method will replace the V subCB method formerly in use. The new method is now being evaluated in production. An increase in failure rate occurred during this period. Through exhaustive investigation, the problem was traced to improper application of the special coating and potting compound. Remedial action was taken, and the problem appears solved, as indicated by latest testing results presented in this report. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1963
- Accession Number
- AD0435564
Entities
People
- J. H. D. Folster
- J. N. Edwards
- L. F. Ritterbush
- R. M. Gagne
Organizations
- Sprague Electric