TOTAL NORMAL AND TOTAL HEMISPHERICAL EMITTANCE OF POLISHED METALS. PART 3
Abstract
The total hemispherical emittance, the total normal emittance, and the variation of electrical resistivity with temperature were measured on aged surfaces of tantalum, niobium, and tungsten in a vacuum over a temperature range from 1000 K to 3000 K (subject to the material). In addition, the normal spectral emittance at 0.65 micron was measured on tantalum and niobium. The total hemispherical emittance was obtained from the measured power dissipation within the uniform temperature region at the center of an electrically heated ribbon; its temperature being measured with a thermocouple or an optical pyrometer when the spectral emittance was known. The total normal emittance was determined by using a radiation thermopile. The ratio of total hemispherical to total normal emittance was also calculated directly from the angular distribution of radiation obtained by revolving the ribbon within the field of view of the thermopile. Some data are also included on molybdenum from a previous report.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1963
- Accession Number
- AD0436887
Entities
People
- G. L. Abbott
Organizations
- Naval Radiological Defense Laboratory