PRODUCTION ENGINEERING MEASURE TYPE 2N1814 SILICON ALLOY TRANSISTOR.

Abstract

The status of all phases of the reliability improvement program is presented. Problems encountered during the fabrication of devices and procedures designed to eliminate the difficulties are presented. The method for determining failure rate for present product through the use of one-thousand hour operating life test is described. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 31, 1963
Accession Number
AD0437189

Entities

People

  • D. Moore
  • G. Mellot
  • P. Kannam
  • R. Pisarcik
  • T. Csakvari

Organizations

  • Westinghouse Electric Corporation

Tags

DTIC Thesaurus Topics

  • Alloys
  • Engineering
  • Fabrication
  • Life Tests
  • Metalloids
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Reliability
  • Silicon
  • Silicon Alloys
  • Transistors

Readers

  • Semiconductor Device Technology
  • Software Engineering