QUARTZ CRYSTAL UNIT TEST SET AN/TSM-20(), 2.5 KC TO 1100 KC,

Abstract

Evaluation of Quartz Crystal Unit Test Set AN/TSM20() is described. The outstanding characteristic of the AN/TSM-20() is its improved drive/resistance compared to that of the Quartz Crystal Unit Test Set TS-+=)/TSM. A means of modifying the TS-710/TSM is described which will make it essentially identical to the AN/TSM-20() except for the extended frequency range of the latter. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1963
Accession Number
AD0437351

Entities

People

  • Dennis Pochmerski
  • Walter H. Bowerman

Organizations

  • United States Army Communications-Electronics Command

Tags

DTIC Thesaurus Topics

  • Frequency
  • Resistance
  • Test Sets

Readers

  • Aerospace Test and Evaluation
  • Materials Science and Engineering.