SEMICONDUCTOR RELIABILITY.
Abstract
The main objectives of the program were to determine quality assurance requirements for specific semiconductor devices, and to determine confidence limits for the shape parameter Beta of the Weibull distribution. A summation of the main findings of the research program is given. Of particular interest is the finding that integral circuits used in digital applications are potentially as reliable as a single discrete transistor used in digital applications. Another finding of significance is that the distribution of field removal rates for diodes in regulator and rectifier applications is approximately the same as the distribution of field removal rates for transistors used in amplifier or high-power applications. On the average, the removal rates for devices in analog (amplifier) applications are approximately 300 times higher than the rates for devices in digital applications. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 31, 1963
- Accession Number
- AD0437692
Entities
People
- Edward T. Kronson
- George J. Blakemore
- William H. Von Alven
Organizations
- ARINC