PRODUCTION ENGINEERING MEASURE. RELIABILITY THRU PROCESS IMPROVEMENT (2N1506).

Abstract

Efforts continued on the establishment of a PEM for the 2N1506 silicon triple diffused transistor. Evaluation of lead attachment and encapsulation techniques were completed. Linear life test results indicate a low failure rate for those improvements incorporated into the 2N1506 production process, and show a capability of providing the desired reliability level. (Author)

Document Details

Document Type
Technical Report
Publication Date
Dec 31, 1963
Accession Number
AD0437914

Entities

People

  • G. Kamienski
  • I. Massaron
  • P. Kellow
  • Rachel N. Austin

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Attachment
  • Encapsulation
  • Engineering
  • Life Tests
  • Performance (Engineering)
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Reliability
  • Test And Evaluation
  • Transistors

Fields of Study

  • Engineering

Readers

  • Electronics Engineering
  • Software Engineering