PRODUCTION ENGINEERING MEASURE. PRODUCTION DEVELOPMENT OF A SILICON PLANAR EPITAXIAL TRANSISTOR WITH A MAXIMUM OPERATING FAILURE RATE OE 0.001% PER 1000 HOURS AT A CONFIDENCE LEVEL OF 90% AT 25C.

Abstract

This report contains the results of e,forts expended in the Reliability Engineering area during the sixth (and final) quarter of the reliability improvement program. Final large scale tests of Al-Al-Au metallization process devices are described and the results compared with previous test results. Parameter distributions and stability during operating and storage life test are discussed as well as comparative failure rates and mechanical ruggedness. An estimate of the failure rate achieved on this program for the Motorola 2N2219 is presented. (Author)

Document Details

Document Type
Technical Report
Publication Date
Oct 31, 1963
Accession Number
AD0437946

Entities

People

  • Paul H. Greer

Organizations

  • Motorola Mobility

Tags

Communities of Interest

  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Engineering
  • Life Tests
  • Production
  • Production Engineering
  • Production Management Methods
  • Productivity
  • Reliability
  • Reliability Engineering
  • Transistors

Fields of Study

  • Engineering

Readers

  • Inertial Navigation Systems.
  • Software Engineering
  • Thin Film Deposition Science.