THIN FILM IMAGE CONVERTER.
Abstract
Details of the fabrication and evaluation of a Zn diffused, Te doped GaP diode are presented. The peak of the spectral emission lies at 7700 A at 297 K for a 200 mu amp bias current. With increasing bias the peak shifts to shorter wavelengths. A shift is also observed at 195 K. When operated at 77 K the spectral peak lies at 6600 A, independent of bias current. The relative intensity at 297 K and 195 K is a superlinear function of bias current at low currents. AT 77 K it is a linear function of current at low currents. GaAs on Ge heterojunctions have been prepared by an open tube technique utilizing a close-spaced transport system. Source and substrate are heated by tungsten lamps. X-ray analyses indicate that the initial growth of GaAs is epitaxial, but as deposition progresses a polycrystalline deposit is formed. A literature survey of the optical properties of GaAsxP1-x has been completed. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- May 20, 1964
- Accession Number
- AD0441646
Entities
People
- Fred C. Pribble
- Paul W. Kruse
- Richard G. Schulze
Organizations
- Honeywell International, Inc.