STUDIES, RESEARCH AND INVESTIGATIONS OF THE OPTICAL PROPERTIES OF THIN FILMS OF METALS SEMICONDUCTORS AND DIELECTRICS.

Abstract

At the time this research was begun, considerable work had already been done in the measurement of optical constants of semi-transparent films by measurement of reflection and transmission coefficients. In seeking an alternate technique of measurement, apparatus developed by O'Bryan was constructed for the measurement of surface values. In attempting to apply this alternate technique to low melting point metals it was found that front and back surfaces of opaque films of these metals exhibited different properties and that quite possibly measurements on the back surfaces would more nearly represent the bulk properties of the metals. The problems encountered in modifying the procedure for light incident through the substrate and some results obtained are the subject of this thesis. (Author)

Document Details

Document Type
Technical Report
Publication Date
Aug 15, 1964
Accession Number
AD0446632

Entities

People

  • Charles H. Scheddy

Organizations

  • Colorado State University

Tags

DTIC Thesaurus Topics

  • Coefficients
  • Compound Semiconductors
  • Dielectrics
  • Electronics
  • Films
  • Materials
  • Measurement
  • Melting
  • Melting Point
  • Metal Films
  • Optical Properties
  • Physical Properties
  • Reflection
  • Semiconductors
  • Substrates
  • Thin Films

Fields of Study

  • Physics

Readers

  • Systems Analysis and Design
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene