RESEARCH AND DEVELOPMENT PROGRAM INTRINSIC RELIABILITY SUBMINIATURE CERAMIC CAPACITORS.
Abstract
Testing of C67 Case Size I capacitors of the improved version at 150 C under voltage stresses as high as 240 V/mil for 3800 hr indicates that this capacitor is intrinsically capable of extremely long life times at milder conditions of temperature and voltage. The testing of 124 of the same capacitors at 200 VDC and 125 C for 2300 hr without catastrophic failure is estimated to be equivalent to testing for 220,000,000 unit-hr at 50 VDC and 85 C without catastrophic failure. This indicates, although at a low confidence level, that this subminiature ceramic capacitor is intrinsically highly reliable. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 30, 1964
- Accession Number
- AD0452561
Entities
People
- P. M. Kennedy
- T. I. Prokopowicz
Organizations
- Sprague Electric