INVESTIGATION OF ULTRA HIGH VACUUM SPUTTERED THIN FILMS.

Abstract

Germanium films were sputtered onto quartz and self-substrates in a low-pressure thermionically supported discharge. Reflection electron diffraction and x-ray examination showed that over comparable temperature ranges the orientation of sputtered geranium on quartz films differed from that of evaporated films. Epitaxy was observed on self-substrates at 150 C. Electrical characteristics of evaporated and sputtered films were strikingly similar despite wide variation in substrate material and temperature and in deposition rates. (Author)

Document Details

Document Type
Technical Report
Publication Date
Nov 30, 1964
Accession Number
AD0454939

Entities

People

  • S. P. Wolsky

Tags

DTIC Thesaurus Topics

  • Absorbers (Materials)
  • Advanced Materials
  • Diffraction
  • Electron Diffraction
  • Electrons
  • Engineered Materials
  • Films
  • Germanium
  • High Vacuum
  • Materials
  • Orientation (Direction)
  • Reflection
  • Substrates
  • Thin Films
  • X Rays

Readers

  • Electrochemical Engineering/ Fuel Cell Technologies
  • Nanofabrication and Microfabrication.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene