STUDY OF EFFECT OF HIGH-INTENSITY PULSED NUCLEAR RADIATION ON ELECTRONIC PARTS AND MATERIALS (SCORRE)

Abstract

Radiation testing of ceramic, glass, tantalum, mica, polystyrene, and mylar capacitors is complete. Data analysis is not complete. New effects were observed when testing glass and tantalum capacitors. Leakage currents in irradiated thin film resistors are principally due to secondary emission and air ionization. No data errors were detected on a magnetic tape that was irradiated. Dosimetry techniques are described, and errors in previous linac dosimetry are discussed. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 19, 1965
Accession Number
AD0461486

Entities

Organizations

  • International Business Machines Corporation (Armonk, NY)

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Counter WMD
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force Facilities
  • Army
  • Capacitance
  • Capacitors
  • Ceramic Capacitors
  • Dose Rate
  • Electron Beams
  • Electronic Components
  • Electronics
  • Electronics Laboratories
  • Film Resistors
  • Gamma Rays
  • Glass Capacitors
  • Military Research
  • Nuclear Radiation
  • Radiation Effects
  • Secondary Emission

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Nuclear and Radiation Engineering.

Technology Areas

  • Microelectronics