CORRELATION OF OPTICAL AND ELECTRON-OPTICAL OBSERVATIONS IN TORSION FATIGUE OF BRASS.

Abstract

Optical micrographs of etched sections of torsion fatigued brass are compared with transmission electron micrographs of foils prepared from comparable specimens. In this way it was possible to elucidate the microstructural changes produced by fatique and shown by optical microscopy by viewing them also at the high resolution of the electron microscope. Dispersed slip of what has been termed the S fatigue range in optical studies corresponded with dispersed 9 x 10 to the 8th power/sq cm. Concentrated slip in what has been termed the F range corresponded with concentrations of dislocations, loops, and debris. Cell formations in what has been termed the H range corresponded with cellular dislocation distributions. (Author)

Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1965
Accession Number
AD0465538

Entities

People

  • J. C. Grosskreutz
  • W. A. Wood
  • W. H. Reimann

Organizations

  • Columbia University

Tags

DTIC Thesaurus Topics

  • Dislocations
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • High Resolution
  • Microscopes
  • Microscopy
  • Observation
  • Optical Analysis
  • Optical Equipment
  • Optical Magnification Devices

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics