A HIGH PRECISION SYSTEM FOR MEASURING SEEBECK COEFFICIENT, ELECTRICAL RESISTIVITY, AND HALL COEFFICIENT IN INHOMOGENEOUS THERMOELECTRIC MATERIALS,
Abstract
This report presents a discussion of problems encountered and solutions developed during the design, construction, and testing of an apparatus for making high-precision measurements of Seebeck coefficient, S, electrical resistivity, alpha, and Hall coefficient, R, in single samples of a number of inhomogeneous, compound semiconductors, over the temperature range from 77 K to ca 500 K. The final design, which is described in detail, was tested for precision under the condition that samples were removed from and remounted in the apparatus between measurements. Under this condition, the variations in remeasuring S and alpha for eleven materials were found to be not larger than =5%. A detailed analysis of the data observed for an Alumel sample is presented. Also under this condition, the variation in remeasuring R for one sample of single-crystal bismuth telluride was found to be not larger than =5%. A detailed analysis of the data observed for an Alumel sample is presented. Also under this condition, the variation in remeasuring R for one sample of single-crystal bismuth telluride was found to be not larger than =2%. These data also are presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 20, 1965
- Accession Number
- AD0466523
Entities
People
- John C. Boteler
- John W. Winslow
- Ronald R. Hart
Organizations
- Naval Radiological Defense Laboratory